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The OBR4600 is the latest model of LUNA's award-winning backlight reflectometer. Specifically designed for device and short-term network testing and fault location, the OBR4600 features backlight level sensitivity for ultra-high resolution. With up to 10 micron spatial resolution, zero dead zone, integrated temperature and stress detection and extension mode, the OBR4600 offers unmatched fiber optic testing capabilities.
The Luna 6415 optical device analyzer uses optical frequency domain reflection (OFDR) technology to obtain backward Rayleigh scattered light or transmitted light as a function of distance by detecting it.The Luna 6415 is the ideal analyzer for photonic integrated circuits and silicon optical chips, thanks to its ultra-high sensitivity and spatial resolution (20 μm).The Luna 6415 single instrument can perform all tests of IL, RL, length, etc. by selecting reflection or The Luna 6415 can perform all tests such as IL, RL, and length by selecting reflection or transmission modes, which greatly reduces test costs and simplifies the test process. Compared with other test systems, it will greatly increase the test yield.